A recent Separation Science feature explores how real-time airborne molecular contamination (AMC) monitoring is helping semiconductor fabrication facilities detect contamination before it leads to yield loss. In the July article, Aimee Cichocki speaks with Dr. Carla Frege, Market Manager for Semiconductors at TOFWERK, and Dr. Rohan Thakur, President of TOFWERK, about the growing need for continuous, compound-specific contamination monitoring as semiconductor devices continue to shrink.
