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2.1. Experimental Characterization and Image Interpretation We employed atomic-resolution SPM imaging techniques (scanning tunneling microscopy (STM) and atomic force microscopy (AFM)) to examine the distribution of CO molecules adsorbed on Cu(111) surfaces using both Cu ( Figure 1 B–D) and CO ( Figure 1 E–G) tips (17) (see Supporting Information Sections 1.1 and 1.2 for details).
1. Introduction Click to copy section linkSection link copied! Adsorption of atoms and molecules on solid surfaces governs a wide range of physical and chemical phenomena, from heterogeneous catalysis and surface reactions to the design of nanoscale devices.
We investigate a scanning probe microscopy image flickering phenomenon, i.e., distinct changes in intensity with the tip height, observed on a B-doped Si(111) reconstructed surface. The phenomenon is exclusively observed in heavily doped systems owing to large variations in the adatom heights ( a.u.) and the existence of bistable subunits upon doping as the probe tip approaches the surface.
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