Conflicts of Interest The authors declare no conflicts of interest. Data Availability Statement The data that support the findings of this study are available within the article and its supporting material. References 1, “Recent Advances on Electromigration in Very-Large-Scale-Integration of Interconnects,” Journal of Applied Physics 94 (2003): 5451–5473. 2, , , et al., “High-Speed Interconnects: History, Evolution, and the Road Ahead,” IEEE Microwave Magazine 23 (2022): 66–82.
