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Data Availability Statement The data that support the findings of this study are available from the corresponding author upon reasonable request. Peer Review For transparency, the peer review documents associated with this article are available at https://doi.org/10.1002/rcm.70183.
In secondary ion mass spectrometry (SIMS), the detection of large organic molecules is accomplished using cluster ion bombardment. Ion formation often proceeds via cationization, through the attachment of (alkali) metal ions to the molecule. To study this process, the emission of secondary ions sputtered from polyethylene glycol (PEG) samples with molecular weights (MW) of 1000–10000 was examined.
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