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1. Introduction A soft error is a change of value in a storage cell or on a circuit line induced by external sources. This commonly occurs when energy-carrying particles, such as alpha particles, protons, low-energy neutrons, and cosmic rays, collide with the chip [ 1 , 2 ]. When the charge caused by the collision exceeds the critical charge, which is proportional to the chip size and supply voltage, a soft error can occur.
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