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Figure 1a illustrates the atomic layer-by-layer synthesis of LaNiO films on LaAlO substrates. Reflection high-energy electron diffraction (RHEED) intensity oscillation patterns during growth are shown for a series of LaNiO films from 0.5 u.c. to 3.5 u.c. in thickness. The half-integer u.c. denotes NiO -terminated films while the integer numbers correspond to LaO-terminated films.
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