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Abstract As engineered systems grow in complexity, there is an increasing need for automatic methods that can detect, diagnose, and even correct transient anomalies that inevitably arise and can be difficult or impossible to diagnose and fix manually.
Abstract As our ability to sense increases, we are experiencing a transition from data-poor problems, in which the central issue is a lack of relevant data, to data-rich problems, in which the central issue is to identify a few relevant features in a sea of observations.
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