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Articles by Simon Dold
Model-free pattern separation of two-color ultrafast X-ray diffraction
Abstract Two-color X-ray imaging with Free Electron Laser pulses offers a powerful approach for probing ultrafast structural dynamics in nanoscale systems, combining (near-)atomic spatial resolution with femtosecond temporal precision. The first X-ray pulse captures the object’s initial state, while the second, time-delayed pulse records its subsequent evolution. A key challenge lies in disentangling the two patterns simultaneously recorded by the same detector.
Nonlinear reversal of photoexcitation on the attosecond time scale improves ultrafast X-ray diffraction images
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Abstract The complex refractive index of a material governs its light-matter interactions, with intense light fields enabling tailored nonlinear optical responses. In the X-ray regime, rapid photoionization limits the potential of nonlinear techniques by inducing irreversible electronic damage. Here we demonstrate that intense, sub-femtosecond X-ray pulses, shorter than typical Auger decay times, can partially reverse photoexcitation via stimulated emission near atomic resonances.
By Anatoli Ulmer, Phay J. Ho, Bruno Langbehn, Stephan Kuschel, Linos Hecht, Razib Obaid, Simon Dold, Taran Driver, Joseph P. Duris, Ming-Fu Lin, David Cesar, Paris Franz, Zhaoheng Guo, Philip Hart, Andrei Kamalov, Kirk A. Larsen, Xiang Li, Michael Meyer, River R. Robles, Adam Summers, Linda Young, Peter Walter, James Cryan, Christoph Bostedt, Daniela Rupp, Agostino Marinelli, Tais Gorkhover, Kazutaka Nakahara, Robert G. Radloff, Lara Rönnebeck, Nick Sudar
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Nature
Verified
Dichography: two-frame ultrafast imaging from a single diffraction pattern
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Abstract We experimentally demonstrate that pairs of time-delayed ultrabright and ultrashort X-ray pulses of two different colors, delivered by modern X-ray Free Electron Lasers, can provide two time-delayed snapshots of a sample. We introduce Dichography, a method that algorithmically separates the diffraction signals overlapping on the detector and independently retrieves the two images of the specimen.
By Linos Hecht, Björn Bastian, Thomas Baumann, Johan Bielecki, Christoph Bostedt, Simon Dold, Thomas Fennel, Christina Graf, Robert Hartmann, Gregor Knopp, Sivarama Krishnan, Björn Kruse, Bruno Langbehn, Tommaso Mazza, Michael Meyer, Christian Peltz, Thomas Pfeifer, Safi Rafie-Zinedine, Antoine Sarracini, Mario Sauppe, Florian M. Schenk, Kirsten Schnorr, Björn Senfftleben, Frank Stienkemeier, Zhibin Sun, Sergey Usenko, Vanessa Wood, Xinhua Xie, Maksym Yarema, Olesya Yarema, Nuri Yazdani, Bernd von Issendorff, Yevheniy Ovcharenko, Marcel Mudrich, Daniela Rupp, Alessandro Colombo, Andre Al Haddad, Subhendu De, Alberto De Fanis, Fanny Goy, Georg Jakobs, Maximilian Joschko, Katharina Kolatzki, Asbjørn Ø. Lægdsmand, Suddhasattwa Mandal, Keshav Sishodia, Rico Mayro P. Tanyag, Paul Tümmler, Carl Frederic Ussling, Hankai Zhang
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Nature
Verified
Direct observation of ultrafast symmetry reduction during internal conversion of 2-thiouracil using Coulomb explosion imaging - Nature Communications
Abstract The photochemistry of heterocyclic molecules plays a decisive role for processes and applications like DNA photo-protection from UV damage and organic photocatalysis. The photochemical reactivity of heterocycles is determined by the redistribution of photoenergy into electronic and nuclear degrees of freedom, initially involving ultrafast internal conversion. Most heterocycles are planar in their ground state and internal conversion requires symmetry breaking.
Observation of molecular resonant double-core excitation driven by intense X-ray pulses - Communications Physics
Abstract The ultrashort and intense pulses of X-rays produced at X-ray free electron lasers (XFELs) have enabled unique experiments on the atomic level structure and dynamics of matter, with time-resolved studies permitted in the femto- and attosecond regimes. To fully exploit them, it is paramount to obtain a comprehensive understanding of the complex nonlinear interactions that can occur at such extreme X-ray intensities.
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