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Abstract We have measured the Seebeck and anomalous Nernst coefficients and corresponding transverse and longitudinal thermoelectric conductivities from 2 to 400 K in thin film (thickness t∼10 nm) Co2MnAlxSi1−x (0≤x≤1) and Co2FeAl grown by molecular beam epitaxy (MBE). A large (−14Am−1K−1 at 300 K) anomalous component of the transverse thermoelectric conductivity is observed in Co2MnAl, especially as contrasted to Co2MnSi (0.28 Am−1K−1 at 300 K).
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