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Yipeng Ning

As seen in: MDPI
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Articles by Yipeng Ning

Research on a Matching Method for Vehicle-Borne Laser Point Cloud and Panoramic Images Based on Occlusion Removal

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By Weiwei Wang, Yipeng Ning, Jiashu Ji, Hanwen Bo
| MDPI
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited. For more information, please refer to https://www.mdpi.com/openaccess.
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A Rapid Segmentation Method of Highway Surface Point Cloud Data Based on a Supervoxel and Improved Region Growing Algorithm

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By Wenshuo Zhao, Yipeng Ning, Xiang Jia, Dashuai Chai
| MDPI
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited. For more information, please refer to https://www.mdpi.com/openaccess.
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A Novel Cycle Slips Detection and Repair Method with AR Model of BDS-3 Dual-Frequency Signal in Severe Multipath Environments

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By Yipeng Ning, Junye Cui, Wenshuo Zhao, Dashuai Chai
| MDPI
This is an early access version, the complete PDF, HTML, and XML versions will be available soon.
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Sensors

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By Jian Wang, Yipeng Ning, Houzeng Han, Xinglong Tan
| MDPI
The monolithic integration of sensors within an electronic microchip is of paramount importance for a huge number of emerging applications, from automotive to medical, from consumer to industrial, from telecom to energy. The common factor among all these fields of application is the interest for sensors that can be fabricated by means of, or are at least compatible with, the process steps that are fundamental for the VLSI technology, and in particular for CMOS.
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