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High spatial resolution and precision NanoSIMS for sulfur isotope analysis Youwei Chen, Zhoujun Xie, Shaohua Dong, Quanliang Lei and Jianfeng Gao Abstract Nano-scale secondary ion mass spectroscopy (NanoSIMS) is a powerful tool for determining the sulfur isotope composition of micrometer-sized minerals. However, the high spatial resolution of δ34S analysis comes at the expense of accuracy, which limits the applicability of NanoSIMS to sulfur isotope analysis.
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