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Bartosz Pruchnik

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Articles

Conductive Atomic Force Microscopy-Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface’s Electrical Properties

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By Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik
| MDPI
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited. For more information, please refer to https://www.mdpi.com/openaccess.
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Four-Point Measurement Setup for Correlative Microscopy of Nanowires

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By Bartosz Pruchnik, Janusz D. Fidelus, Ewelina Gacka, Krzysztof Kwoka
| MDPI
1. Introduction In recent years, nanowires (NWs) have found applications in contemporary electronics, for example in MOSFET transistors, energy harvesting devices and photovoltaic circuits. Knowledge of the electrical parameters of NWs is essential for the use of these structures in electronic circuits [1], which is a promising area, as NWs exhibit various interesting mechanical and mechanoelectrical properties [2,3].
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Correlation between Friction and Wear in Cylindrical Anchorages Simulated with Wear Machine and Analyzed with Scanning Probe and Electron Microscope

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By Dominik Badura, Bartosz Pruchnik, Ewelina Gacka, Władysław Kopczyński
| MDPI
Open AccessArticle by Tomasz Dąbrowa 1, Dominik Badura 2,*, Bartosz Pruchnik 2, Ewelina Gacka 2, Władysław Kopczyński 2, Marcin Mikulewicz 3, Teodor Gotszalk 2 and Edward Kijak 1 1 Department of Prosthodontics, Wrocław Medical University, ul.
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