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Christian Kehrer Electronics

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Articles

Save Your Crash Test Dummy

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By TestDesign Hardware, Christian Kehrer Electronics, Christian Kehrer
| Design News Verified
The finite element (FE) method, the Internet of Things (IoT), machine learning, digital twins. A lot of fancy technical buzzwords that, when applied to the manufacturing process, all seek to capture the same ancient idea: Measure twice, cut once. Simulation and testing processes of one form or another have long been critical to manufacturing.
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