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Devan James Atkinson on Muck Rack

Devan James Atkinson

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An artificial neural network for digital image correlation dynamic subset selection based on speckle pattern quality metrics

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By Mechatronic Engineering, Melody van Rooyen, Thorsten Becker, Devan James Atkinson
| Wiley Online Library Verified
1 INTRODUCTION Widespread adoption of digital image correlation (DIC) has prompted extensive investigation of its error sources leading to the development of improved DIC algorithms to mitigate these thereby enabling more accurate and reliable displacement measurements.1-4 Furthermore, the International DIC Society provides a ‘Good Practices Guide’,5 part of which aims to better identify and limit errors through effective experimental design.
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