Diplesh Gautam on Muck Rack

Diplesh Gautam

As seen in: MDPI, Sensor Review
Is this you? As a journalist, you can create a free Muck Rack account to customize your profile, list your contact preferences, and upload a portfolio of your best work. Claim your profile

Get in touch with Diplesh

Contact Diplesh, search articles and posts on X, monitor coverage, and track replies from one place.

Learn more about Muck Rack

Actions

Share this page

Is this you?

As a journalist, you can create a free Muck Rack account to customize your profile, list your contact preferences, and upload a portfolio of your best work.
Claim your profile

Articles

Development of Non-Destructive Dynamic Characterization Technique for MMCs: Predictions of Mechanical Properties for Al@Al2O3 Composites

|
By Ajay D. Pingale, Diplesh Gautam, Ayush Owhal, Dhruv Deshwal
| MDPI
Altmetric share Share announcement Help format_quote Cite thumb_up ... Endorse textsms ... Comment Need Help? Support Find support for a specific problem in the support section of our website. Get Support Feedback Please let us know what you think of our products and services. Give Feedback Information Visit our dedicated information section to learn more about MDPI. Get Information clear Font Type: Arial Georgia Verdana Line Spacing:    Column Width:    Open AccessArticle by Ajay D.
Open in Who Shared Issue with article?
See all 1 licensed articles (2 Total)
 •  Privacy  •  Terms  •  Security and Legal  •   •   •   • 

© 2026 Muck Rack

SOC 2® Certified