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Ewins Pon Pushpa

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Articles

Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

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By Bharathi Raj Muthu, Ewins Pon Pushpa, Vaithiyanathan Dhandapani, Kamala Jayaraman
| MDPI
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited.
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