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Improving axial resolution in Structured Illumination Microscopy using deep learning

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By Miguel Boland, Seth Flaxman, Boland Miguel A, Flaxman Seth R
| royalsocietypublishing.org
1. Introduction Structured Illumination Microscopy (SIM) is a super-resolution technique which enables a twofold increase in lateral resolution (X/Y axis, perpendicular to the line of sight of the microscope) when compared to conventional fluorescence microscopy [1,2]. SIM functions via the illumination of structured light onto a specimen to obtain spectral information that would be out of the range visible to a wide-field microscope.
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