Gabriele Barrera

Diederik S. Wiersma European Laboratory for Non-linear Spectroscopy LENS, Università degli studi di Firenze, Dipartimento di Fisica, Via G. Sansone 1 Sesto Fiorentino, Firenze, 50019 Italy Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce, 91, Torino, 10135 Italy Search for more papers by this author

Characterization Techniques Scanning electron microscopy (SEM - FEI InspectF) were exploited to study the morphology and shape of the FeGa dot array through top-view imaging. The micrographs were analysed by the elliptical fitting tool of the open source software Imagej. Additionally, an integrated EDX detector on the SEM was used to measure the composition of the FeGa alloy.

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