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Articles

Atomistic Probing of Defect-Engineered 2H-MoTe2 Monolayers

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By Dong-Hwan Yang, Seung-Young Seo, Jewook Park, Gunho Moon
| dx.doi.org
Download Hi-Res ImageDownload to MS-PowerPointCite This:ACS Nano 2024, XXXX, XXX RETURN TO ARTICLES ASAPPREVArticleNEXT Odongo Francis Ngome Okello Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), 77 Cheongam-ro, Nam-gu, Pohang-si 37673, Republic of Korea Samsung Electronics, Foundry Analysis & Engineering Team, Global Manufacturing & Infra Technology, Samsungjeonja-ro 1, Hwaseong-si 18448, Republic of Korea , Dong-Hwan Yang Department of...
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