Hien-Thanh Le on Muck Rack

Hien-Thanh Le

As seen in: MDPI, International Journal of Optics
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Articles

Applied Sciences | Free Full-Text | Enhancement of a Single-Axis Femtosecond Laser Scanning System by Using Two Galvanometers to Improve the Telecentricity and the Effective Scanning Length on Laser Process

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By Hsiao-Yi Lee, Xuan-Huy Nguyen, Chao-Ming Chen, Hien-Thanh Le
| MDPI
Abstract : The galvanometer scanning system plays a crucial role in modern laser material processing. With the development of this industry, the requirements for galvanometer scanners are getting higher and higher, especially to overcome the inherent disadvantages that still exist, such as image distortion, marking speed and accuracy in state-of-the-art scanning systems.
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