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Hwoibin You

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Defect-mediated generation–recombination dynamics governing conductance response in floating-body transistors

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By Been Kwak, Changhyeon Han, WonGi Hong, Joonhyeok Choi, Youngchan Cho, Sangwan Kim, Wonjun Shin, Daewoong Kwon, Hwoibin You
| Nature Verified
Abstract As CMOS technologies evolve toward ultra-thin floating-body architectures, defect-mediated carrier dynamics increasingly dominate device behavior, challenging conventional linear interpretations of electrical response in nanoscale transistors. In this work, we demonstrate that the conductance response of foundry-fabricated floating-body transistors is governed by generation–recombination (GR) dynamics associated with deep-level defects inside the ultra-thin silicon body.
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