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Hyeonhong Min

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Digital twin platform for accelerating optimization of oxide semiconductor transistors to overcome fundamental performance-reliability trade-off

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By Minjong Lee, Seungbin Lee, Si Joon Kim, Jiyoung Kim, Sourav Dutta, Tanvir H. Pantha, Kharanshu Bhojak, Mingyeong Jo, Hyeonhong Min, Gawnghyeon Jang, Shumiya Alam
| Nature Verified
Abstract Amorphous oxide semiconductor (AOS) transistors are promising candidates for next-generation logic and high-density memory applications, particularly for back-end-of-line-compatible monolithic three-dimensional integration. However, optimizing their performance and long-term reliability requires exploring a complex, high-dimensional fabrication parameter space with significant experimental cost.
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