I. Capan on Muck Rack

I. Capan

Zagreb
As seen in: AIP Publishing
Solid state physicist I Senior Scientist I Head of Semiconductors Lab @institutrb I Externel expert at EC I Opinions are my own
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Articles

M-center in low-energy electron irradiated 4H-SiC

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By T. Ohshima, T. Makino, I. Capan
| AIP Publishing
Open Appl. Phys. Lett. 120, 252101 (2022); https://doi.org/10.1063/5.0095827 We report on the low-energy electron irradiated 4H-SiC material studied by means of deep-level transient spectroscopy (DLTS) and Laplace-DLTS. Electron irradiation has introduced the following deep level defects: EH1 and EH3 previously assigned to carbon interstitial-related defects.
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