Ira A. Fulton College of Engineering; Electrical and Computer Engineering https://lib.byu.edu/about/copyright/ Brown, Jacob D., "The Reliability of YOLO Object Detection on the AMD Versal in a Proton Radiation Environment" (2026). Theses and Dissertations. 11283. https://scholarsarchive.byu.edu/etd/11283 Versal, FPGA, fault injection, fault tolerance, radiation testing, SEU, AI, deep learning, YOLO