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Articles by Jin CH
DiffWaferNet: a lightweight differential attention-based network for wafermap defect classification
The rapid advancement of semiconductor technology has significantly increased the complexity of manufacturing processes, where wafer maps serve as essential visual summaries of wafer test results. These maps capture diverse defect patterns arising from material inconsistencies, equipment malfunctions, and process deviations (Batool et al., 2021).
Ensemble attention deep network for imbalanced silicon wafer defect inspection
Ensemble attention deep network for imbalanced silicon wafer defect inspection 1Department of Computer Science, Air University, Kharian, Pakistan 2Department of Computer Science, Faculty of Computing and IT, University of Gujrat, Gujrat, Punjab, Pakistan 3Centre for Artificial Intelligence and Robotics, Malaysia-Japan International Institute of Technology, Universiti Teknologi Malaysia, Kuala Lumpur, Malaysia 4Department of Computer Science, Faculty of Information Technology, Zarqa...
Recent Advances in Research on Active Compounds Against Hepatic Fibrosis
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High-normal unconjugated bilirubin is associated with decreased risk of chronic kidney disease in type 2 diabetes: A real-world study
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