Junghyun Shin on Muck Rack

Junghyun Shin

As seen in: Nature
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Articles

Automated System for Attomolar-Level Detection of MiRNA as a Biomarker for Influenza A Virus

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By Junghyun Shin, Jeongsu Kim, Sunwoo Bang, Danmin Choi
| dx.doi.org
Open in Who Shared Issue with article?

Scaling analysis of field-tuned superconductor-insulator transition in two-dimensional tantalum thin films

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By Sungyu Park, Junghyun Shin, Eunseong Kim
| Nature Verified
Ta thin films are characterized by X-ray diffraction (XRD) and atomic force microscope (AFM) measurements. Figure 1 shows the XRD results for Ta thin films with various thicknesses. Ta films with a thickness greater than 5?nm reveal a crystalline peak at ~37°, which is attributed to the local body-centered cubic (?-phase) correlation38. However, films with a thickness less than 5?nm do not show any peak structures in XRD, which indicates that these thin films are highly amorphous.
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