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Kiroubanand Sankaran on Muck Rack

Kiroubanand Sankaran

As seen in: Physical Review B
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Articles

First-principles investigation of thickness-dependent electrical resistivity for low-dimensional interconnects

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By Benoit Van Troeye, Kiroubanand Sankaran, Zsolt Tokei, Christoph Adelmann
| Physical Review B
The relentless miniaturization of transistors drives the search for alternative metals to copper for low-dimension interconnects. Indeed, some elementary metals, like ruthenium, become less resistive than copper at low dimensions, leading to smaller losses in the connection lines. For most parts, such knowledge is still lacking for binary metals and other alloys.
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