Lingyin Zhang

1 Introduction Scanning Probe Microscopy (SPM) is an advanced microscopic imaging technique that employs an atomically sharp tip to traverse the sample surfaces, revealing the microscopic topography of the surfaces and detecting local chemical/physical properties.[1-9] One of the most significant Scanning Probe Microscopes is Scanning Tunneling Microscope (STM).[10-12] STM has been extensively used to characterize the structural and electronic properties of nanomaterials and molecules,...