Mattia Bartoli

Methods: Materials Characterization Powder XRD analysis was performed using a PANalytical X’Pert PRO diffractometer equipped with a Cu Kα radiation source. The diffraction patterns were recorded over a 2θ range of 15–90° with a step size of 0.026°. The Scherrer equation (Equation (3)) and the HighScore Analysis Software were used to calculate the crystallite size (D), according to the following equation.

4. CNT Growth Through CVD CVD is considered to be a low-cost process for the production of CNTs, and it is the most commonly used method for the deposition of CNT thin films. The most relevant features of this technique are the high yield of CNTs produced and the temperature requirements []. Furthermore, CVD enables great control over both the morphology and structure of the CNTs, leading to the growth of aligned CNTs [,] with reasonably low residence times [].

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