Maya Elizabeth More

MOSFET(Metal-Oxide-Semiconductor Field-Effect Transistor) plays a crucial role in both automative and aero industries. However, the cycle heat and electrical stress reduces its performance. This research develops a model for using external appearance aging with measurements on White-Light Spectroscopy, FTIR (Fourier Transform Infrared Spectroscopy), and Profilometry to predict internal performance aging of SiC MOSFETs undergoing HTGB (High-Temperature Gate Bias) aging.

0 users 0 questions (Ask a question) 0 review(s) (Review this) Power electronics play a critical role in automotive systems, impacting everything from lighting to motor control. For these components to be safe and efficient, they must be reliable, even after repeated exposure to high thermal and electrical stress. Although aging mechanisms have been widely studied, most prior work examines either internal electrical degradation or external material changes with limited overlap.