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Author Correction: Mechanically reliable and electronically uniform monolayer MoS2 by passivation and defect healing - Nature Communications
Correction to: Nature Communications https://doi.org/10.1038/s41467-025-62370-0, published online 2 August 2025 In the version of the article initially published, the “SiO2” label in Fig. 2c should have read “Au/Ti/SiO₂/Si”. In the caption of Fig.
Mechanically reliable and electronically uniform monolayer MoS2 by passivation and defect healing - Nature Communications
Abstract Monolayer molybdenum disulfide (MoS₂), a two-dimensional transition metal dichalcogenide (2D TMD), is at the forefront of logic device scaling efforts due to its semiconducting properties, good carrier mobility, and atomically thin structure. However, the high defect density of monolayer MoS2 hinders its reliability for long-term, device-scale applications.
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