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Aluminum Oxide Films and Sapphire Demonstrate Interaction of Sample Preparation and Instrumentation for XPS Measurements of Layered Materials
Conflicts of Interest The authors declare no conflicts of interest. References 1, “Growth of Surface Analysis and the Development of Databases and Modeling Software for Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy,” Microscopy Today 24, no. 2 (2016): 16–23, https://doi.org/10.1017/S1551929516000080.
Upgrading of the Old Pt@Al2O3 Using Al(OH)3 as Alumina Precursors with Remarkable Catalytic Hydrogen Combustion Performance at Room Temperature
CombustionJune 5, 2025 Nadezhda Abel , Institut de Recherches sur la Catalyse et l’Environnement de Lyon (IRCELYON), CNRS, Université Claude Bernard Lyon 1, 2 Avenue Albert Einstein, 69626 Villeurbanne, France Produits Berger, Route d’Elbeuf, 27520 Grand Bourgtheroulde, France Pascal Bargiela Université de Pau et des Pays de l’Adour, CNRS, IPREM, Technopôle Helioparc, 2 Avenue du président Pierre Angot, 64053 Pau, France Marion Eternot , Institut de Recherches sur la Catalyse et...
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