Is this you? As a journalist, you can create a free Muck Rack account to customize your profile, list your contact preferences, and upload a portfolio of your best work.
Claim your profile
Get in touch with Peiyu
Contact Peiyu, search articles and posts on X, monitor coverage, and track replies from one place.
Learn more about Muck RackActions
Is this you?
As a journalist, you can create a free Muck Rack account to customize your profile, list your contact preferences, and upload a portfolio of your best work.Articles
Physics-Embedded End-To-End Differentiable Framework for High-Precision and Robust Interferometry
Conflicts of Interest The authors declare no conflicts of interest. Data Availability Statement The data that support the findings of this study are available from the corresponding author upon reasonable request. Supporting Information Filename Description lpor71606-sup-0001-SuppMat.pdf17.3 MB Supporting File: lpor71606-sup-0001-SuppMat.pdf. References 1 D. Malacara, Ed., Optical Shop Testing, 3rd ed., ser. Wiley Series in Pure and Applied Optics (John Wiley & Sons, 2007).
Actions
Is this you?
As a journalist, you can create a free Muck Rack account to customize your profile, list your contact preferences, and upload a portfolio of your best work.Get in touch with Peiyu
Contact Peiyu, search articles and posts on X, monitor coverage, and track replies from one place.
Learn more about Muck Rack