Migrating the manufacture of GaN power devices to 300 mm lines will boost yield, improve metrology and trim costs. BY RICHARD STEVENSON, EDITOR, CS MAGAZINE A common metric for measuring performance of any device is the bang per buck. When it comes to GaN, there are many ways to measure that ‘bang’. They include the on-resistance, the breakdown voltage, and the mobility of the two-dimensional electron gas. But what about the ‘buck’?