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Samik Roy Moulik on Muck Rack

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Articles

Precision-controlled ultrafast electron microscope platforms. A case study: Multiple-order coherent phonon dynamics in 1T-TaSe2 probed at 50 fs-10 fm scales | Structural Dynamics | AIP Publishing

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By East Lansing, Andres Tehlar, Samik Roy Moulik, C.-Y. Ruan
| American Institute of Physics
Transmission electron microscope (TEM) is a powerful materials characterization tool that offers nanoscale information on a wide range of materials and devices, which has been crucial for materials research.1 The main advantage with electron-based technology in comparison with x rays as a structural probe lies in its flexible use of field-based electron optics for multimodal operation, uniting crystallography, imaging, and spectroscopy with relative ease.
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Gigahertz streaking and compression of low-energy electron pulses

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By Andres Tehlar, Samik Roy Moulik
| American Institute of Physics
FIG. 5. Measurement of electron pulse duration and compression using transient electric fields. (a) Schematic of the setup with electron gun, compression cavity, metal grid, and detector. Sketch of four phase-space distributions throughout the propagation.
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High energy electron diffraction instrument with tunable camera length

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By P. Musumeci, Samik Roy Moulik, Andres Tehlar
| American Institute of Physics
Ultrafast electron diffraction (UED) enables following the dynamical evolution of matter at fundamental atomic spatial and temporal scales.
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