Sreetama Banerjee on Muck Rack

Sreetama Banerjee

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Direct Assessment of Defective Regions in Monolayer MoS2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements

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By Albert Minj, Ankit Nalin Mehta, Vivek Mootheri, Sreetama Banerjee
| dx.doi.org
Download Hi-Res ImageDownload to MS-PowerPointCite This:ACS Nano 2024, XXXX, XXX Terms & Conditions Most electronic Supporting Information files are available without a subscription to ACS Web Editions. Such files may be downloaded by article for research use (if there is a public use license linked to the relevant article, that license may permit other uses).
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