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Sthitie Bom

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Articles

Artificial Intelligence with Open and Scaled Data Sharing in Semiconductor Manufacturing - Workshop Report

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By Sthitie Bom, Jim Davis, Bruce Kramer, Gregory Vogl
| nist.gov
Sthitie Bom, Jim Davis, , , , Don Ufford The Workshop sponsored by the National Science Foundation (NSF) (NSF award 2334590, "Artificial Intelligence with Open and Scaled Data Sharing in the Semiconductor Industry") and supported by the National Institute of Standards and Technology (NIST) was organized to evaluate the promise of scaled Data Sharing in data and operational ecosystems.
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Optimizing Product Quality Prediction in Smart Manufacturing Through Parameter Transfer Learning: A Case Study in Hard Disk Drive Manufacturing

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By Yu Huang, Sthitie Bom, Somyot Kaitwanidvilai, Chaiwat Sittisombut
| MDPI
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited. For more information, please refer to https://www.mdpi.com/openaccess.
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Soft-Sensing Regression Model: From Sensor to Wafer Metrology Forecasting

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By Yu Huang, Fei Xu, Angzhi Fan, Sthitie Bom
| MDPI
1. Introduction The strategic importance of AI technologies in the semiconductor industry lies in their capacity to minimize capital requirements and enhance cycle time and yields. This presents a considerable opportunity to introduce pioneering machine learning methods that can optimize our manufacturing processes and improve their efficiency significantly.
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