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Polarization-sensitive differential phase-contrast microscopy

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By Chulmin Joo, Soocheol Kim, Seungri Song, Sunwoong Hur
| osapublishing.org
Abstract We present a novel, to the best of our knowledge, form of polarization microscopy capable of producing quantitative optic-axis and phase retardation maps of transparent and anisotropic materials. The proposed method operates on differential phase-contrast (DPC) microscopy that produces a phase image of a thin specimen using multi-axis intensity measurements. For polarization-sensitive imaging, patterned illumination light is circularly polarized to illuminate a specimen.
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