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Tejasva Vashistha on Muck Rack

Tejasva Vashistha

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Articles

Atomistic Modeling of Processing–Structure–Property Correlations in Thin Films: A Critical Review

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By Harsh Jain, Tejasva Vashistha, Kishalay Raj
| Wiley Online Library Verified
1 Introduction Thin films, defined as material layers ranging in thickness from a few nanometers to several micrometers are essential for several cutting-edge materials applications. Their reduced dimensionality provides distinct physical and chemical properties, making them irreplaceable in electronics, optics, energy systems, protective coatings, and biomedical devices [1].
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