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Thijs Stavenga on Muck Rack

Thijs Stavenga

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Articles

Ultrafast scanning electron microscopy with sub-micrometer optical pump resolution

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By Martin Lee, Thijs Stavenga, Jacob P. Hoogenboom
| AIP Publishing
Open Applied Physics Reviews 9, 021418 (2022); https://doi.org/10.1063/5.0085597 Ultrafast scanning electron microscopy images carrier dynamics and carrier induced surface voltages using a laser pump electron probe scheme, potentially surpassing all-optical techniques in probe resolution and surface sensitivity.
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