Yongwon Jo on Muck Rack

Yongwon Jo

As seen in: Nature, MDPI
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Articles

Super-resolution approach tailored for wafer transmission electron microscopy images

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By Sungsu Kim, Yongwon Jo, Seoung Bum Kim, Insung Baek, Hansam Cho, Heejoong Roh, Kyunghye Kim, Munki Jo, Jaeung Tae
| Nature Verified
Abstract High-resolution wafer transmission electron microscopy (TEM) images are essential for nano-level analysis in semiconductor manufacturing. Although super-resolution offers significant potential for obtaining high-resolution images, training super-resolution models for wafer TEM images remains challenging because of wafer TEM-specific noise, the lack of paired low- and high-resolution images, and the need for clear edge preservation.
Open in Who Shared Issue with article?

Spatio-Temporal Network for Sea Fog Forecasting

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By Young Jae Lee, Jaehoon Kim, Jinhyeok Park, Yongwon Jo
| MDPI
This is an early access version, the complete PDF, HTML, and XML versions will be available soon.
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