Ambarneil Saha

Abstract Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios via single-electron counting. However, accurately counting electrons at high flux remains challenging. We developed a new method of electron counting for direct electron detectors, Back-Propagation Counting (BPC).

Introduction Click to copy section linkSection link copied! Metal–organic frameworks (MOFs) have attracted interest for a range of applications, including catalysis, (1,2) drug delivery, (3,4) and gas storage and separations. (5−10) For gas storage and separations, these materials enable the tuning of host–guest interactions between the framework and small molecules.

3D Electron Diffraction Although the pn–Mg 2 (dobpdc) crystals diffracted well ( Figures 3 a and S6 ), their submicron size ( Figures 4c and S1 ) precluded SCXRD as a viable method for structural elucidation, rendering the sample a good candidate for 3D ED. Furthermore, both the CO 2 -adsorbed phase and the activated phase could be accessed within the working parameters of the TEM.