Azriel Goldschmidt

Abstract Electron microscopy (EM) is a foundational tool for directly assessing the structure of materials. Recent advances in direct electron detectors have improved signal-to noise ratios via single-electron counting. However, accurately counting electrons at high flux remains challenging. We developed a new method of electron counting for direct electron detectors, Back-Propagation Counting (BPC).

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Preprint Article Version 1 This version is not peer-reviewed Version 1 : Received: 2 January 2024 / Approved: 3 January 2024 / Online: 4 January 2024 (03:38:17 CET) Turqueti, M.; Wagner, G.; Goldschmidt, A.; Carney, R. Digital Miniature Cathode Ray Magnetometer. Preprints 2024, 2024010195. https://doi.org/10.20944/preprints202401.0195.v1 Turqueti, M.; Wagner, G.; Goldschmidt, A.; Carney, R. Digital Miniature Cathode Ray Magnetometer. Preprints 2024, 2024010195.