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Fusheng Qiu on Muck Rack

Fusheng Qiu

As seen in: Optica
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Articles

Electro-optic coefficients measurement based on a multiple-reflection Mach-Zehnder interferometer

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By Fusheng Qiu, Weigang Zhao, Wenting Diao, Yongyong Zhuang
| Optica Verified
Multiple-reflection (MR) effects in flat optical crystals can cause significant errors in electro-optic coefficient (EOC) measurements. We present a Mach–Zehnder interferometer method that incorporates MR modeling and suppresses its influence by selecting specific incidence angles [$\Theta = {2}\;{\rm m}\pi$ and $\Theta = ({2}\;{\rm m} + {1})\pi$]. Numerical simulations with congruent lithium niobate show that angular deviations below 0.1 limit EOC errors to ${\lt}{2.5}\%$.
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Single-path electro-optic coefficients measurement approach using multiple reflection interference

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By Hui Chen, Xiaotian Fu, Fusheng Qiu, Weigang Zhao
| osapublishing.org
Abstract An electro-optic coefficient (EOC) is an important optical property of optical crystals. In this work, a single-path multiple reflection interferometer is proposed to measure the components of signed EOCs with high precision. With the help of the normalization method, the influence of incident light was removed, and repeatability of the experimental results was improved.
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