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Kunqian Yang on Muck Rack

Kunqian Yang

As seen in: Optica
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Articles

Accurate optoelectronic third-order nonlinearity characterization using improved carrier-shifted phase modulation

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By Yunqi Liao, Shilong Pan, Kunqian Yang, Yuqing Heng
| Optica Verified
We propose and demonstrate an optoelectronic method for accurately characterizing the third-order nonlinearity of photodetectors (PDs) using improved carrier-shifted phase modulation. A carrier-shifted phase-modulated probe signal is injected into the PD under test, and the third-order nonlinear characteristics are extracted by measuring the powers of the fundamental and third-order intermodulation distortion (IMD3) components as the probe signal power is swept.
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