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Masahiko Ishino on Muck Rack

Masahiko Ishino

  • Senior Analyst, Tokai Tokyo Research Institurte Co., Ltd
Tōkyō
As seen in: Optica
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Articles

Sub-nanometer scale depth patterning on sapphire crystal by femtosecond soft x-ray laser pulse irradiation

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By Masaharu Nishikino, Katsuhiro Mikami, Masahiko Ishino, Thanh-Hung Dinh
| Optica Verified
Damage thresholds and structures on a metal aluminum and an aluminum oxide crystal induced by the soft x-ray free electron laser irradiations were evaluated. Distinctive differences in damage thresholds and structures were observed for these materials. On the aluminum oxide crystal surface, in particular, a novel, to the best of our knowledge, surface processing, which we suggest defining as “peeling,” was recognized.
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