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Mingying Wu

As seen in: ScienceDirect, MDPI
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Articles

Reliability Analysis of Complex Structures Under Multi-Failure Mode Utilizing an Adaptive AdaBoost Algorithm

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By Feng Zhang, Mingying Wu, Zijie Qiao, Yuxiang Tian
| MDPI
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited. For more information, please refer to https://www.mdpi.com/openaccess.
Open in Who Shared Issue with article?

Charge transfer complex induced confinement effect between organic semiconductor and polymer chains for enhancing high-temperature capacitive energy storage

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By Lizhi Yan, Yaonan Du, Mingying Wu, Qiudi Tu
| ScienceDirect Verified
High-power-density dielectric capacitors, known for their rapid charge–discharge capabilities, are essential components within sophisticated electronic and electrical systems [1], [2], [3], [4]. Polymeric film capacitors have gained significant attention in the field of energy storage due to their numerous advantages, such as flexibility, formability, unique self-healing properties, and higher breakdown field (Eb) in comparison to ceramic counterparts [5], [6], [7], [8].
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