Peihuang Lou

To expand the reliability of interferometry technology, this paper proposes a random two-frame algorithm with high accuracy, high robustness, and immunity to tilt phase-shift. This method uses the equivalence of inter-frame phase-shift and intra-frame phase difference to mine light intensity pixels carrying new phase-shift from different images.

1. Introduction With the development of digital production and intelligent manufacturing from concept to maturity and into engineering application, measurement technology in mechanical manufacturing processes is continuously being improved [1,2]. In response to the rapid development of the automobile industry, auto parts suppliers must look beyond the traditional measurement methods to meet the high-quality requirements of the whole vehicle [3,4].

This is an early access version, the complete PDF, HTML, and XML versions will be available soon. Open AccessArticle by Leisheng Chen * and Peihuang Lou College of Mechanical & Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China * Author to whom correspondence should be addressed. Appl. Sci.