Prathan Buranasiri

This work aims to utilize a phase-shifting technique in a rectangular-type Sagnac interferometer (RTSI) to measure the thickness of a thin film of nickel (II) oxide (NiO) in an electron transport layer (ETL) in perovskite solar cell preparation. The NiO layer is deposited on a fluorine-doped tin oxide (FTO) glass substrate. In the RTSI setup, the signal output from the interferometer is divided into the reference and testing arms using a nonpolarizing beam splitter (NPBS).

We review Fourier-domain methods for demosaicking Bayer-filter color cameras and monochrome polarization cameras, and then generalize the approach for the quad-Bayer-filter mosaic and for color-polarization cameras. For each of these four mosaic filter types, we provide theoretical expressions for the sampling functions, the Fourier-domain channels, and the linear combination of reconstructed channels (the demosaicking algorithm) needed to estimate the input (presampled) image.

This work has implemented a diverse modification of the Sagnac interferometer to accommodate various measurement requirements, including phase shifting, pattern recognition, and a morphological analysis. These modifications were introduced to validate the adaptability and versatility of the system.