Shaoting Qi

Single-pixel microscopy enables observation of micro samples in invisible wave bands. Finding the focus position is essential to capture a clear image of a sample but could be difficult for single-pixel microscopy particularly in invisible wave bands. It is because the structured patterns projected onto the sample would be invisible and searching for the focus position manually could be exhausting. Here, we report an autofocus method for Fourier single-pixel microscopy.

Abstract Autofocusing is widely used in applications where sharp image acquisition or projection is needed. Here we report an active autofocusing method for sharp image projection. The method works with wide-field structured illumination and single-pixel detection. To find the focus position, the method illuminates the target object with a set of 3-step phase-shifting Fourier basis patterns repeatedly and collects the backscattered light by using a single-pixel detector through a grating.

Abstract Fourier single-pixel imaging (FSI) uses Fourier basis patterns for spatial light modulation to acquire the Fourier spectrum of the object image. The object image can be reconstructed via an inverse Fourier transform. However, the Fourier basis patterns are inherently gray scale, which results in the difficulty that the patterns can hardly be generated at a high speed by using a commonly used spatial light modulator–digital micromirrors device.